Continuous Dynode Electron Multiplier (CDEM) used with a variety of FEI FIB-SEM systems, such as the DB235, 835, 865, 1265 and Certus systems. Let us know which system you use and we'll make sure your CDEM ships with the proper mounting bracket for quick installation.
Able to detect either secondary electrons or ions, we describe this as the "bullet style" of CDEM to differentiate it from that used for FEI single beam FIB systems such as the FIB200 and FIB800 tools.
|Resistance, nominal||>375 MOhms|
|Typical Dark Count||<0.05 CPS|
Identical to CDEMs sold by the original equipment manufacturer, our customers SAVE with better pricing and fast delivery. This item is a direct replaement for FEI p/n 4035 272 05751.