Custom SEM and FIB solutions
Come visit us in Booth 306
HyperFIB
The Fastest FIB for Failure Analysis, Reverse Engineering and Micro-machining
Custom SEMs & System Upgrades
FIB & SEM Consumables
SEM & FIB Sources, Apertures, Gas Chemistries
Services
HyperFIB micromachining, SEM & AFM imaging
FIB & SEM Spare Parts
Come visit us in Booth 415
FIB & SEM Column Components
CamScan Electron Optics
System Upgrades, Spare Parts & Consumables
Contact Us - We're Here to Help

Welcome to Applied Beams

We provide custom-configured SEM and FIB systems, micromachining and analytical services, and bring new life to your microscope with products which extend and enhance system performance.

We've brought the CamScan Electron Optics electron microscopes back to market and offer customized versions of the popular CS-series of SEMs...Read more
Our high-current HyperFIB system is the only plasma FIB upgrade on the market for legacy FIB tools, increasing available current for micromachining, cross-sectioning and material deposition from just 20nA to over 10uA, an improvement of over 500X!...Read more
With high quality, affordable consumables and refurbished spare parts, we keep your FIB, SEM and dual column FIB-SEM operating at optimum performance and on budget....Read more
Our micromachining services utilize our unique HyperFIB systems. With up to 10uA of beam current this tool is perfect for preparing cross-sections of advanced semiconductor devices and delayering all or a portion of a semiconductor device....Read more

 


We accept these credit cards

and gladly provide quotations on request

Receive Product Updates