Custom SEM and FIB solutions
The Fastest FIB for Failure Analysis, Reverse Engineering and Micro-machining
Custom SEMs & System Upgrades
FIB & SEM Consumables
SEM & FIB Sources, Apertures, Gas Chemistries
HyperFIB micromachining, SEM & AFM imaging
FIB & SEM Spare Parts
Applied Beams has a GSA Schedule contract GS-07F-018DA
Applied Beams is a proud vendor to the US government.
FIB & SEM Column Components
CamScan Electron Optics
System Upgrades, Spare Parts & Consumables
Contact Us - We're Here to Help

Welcome to Applied Beams

We provide custom-configured SEM and FIB systems, micromachining and analytical services, and bring new life to your microscope with products which extend and enhance system performance.

We've brought the CamScan Electron Optics electron microscopes back to market and offer customized versions of the popular CS-series of SEMs...Read more
Our high-current HyperFIB system is the only plasma FIB upgrade on the market for legacy FIB tools, increasing available current for micromachining, cross-sectioning and material deposition from just 20nA to over 10uA, an improvement of over 500X!...Read more
With high quality, affordable consumables and refurbished spare parts, we keep your FIB, SEM and dual column FIB-SEM operating at optimum performance and on budget....Read more
Our micromachining services utilize our unique HyperFIB systems. With up to 10uA of beam current this tool is perfect for preparing cross-sections of advanced semiconductor devices and delayering all or a portion of a semiconductor device....Read more


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  • 14855 SW Murray Scholls Drive
    Beaverton, Oregon USA 97007