The FEI Sidewinder and Tomahawk FIB columns generate excellent ion beam profiles for cross-sectioning and TEM sample preparation of ultra-small geometries.

These advanced FIBs have been used in the FEI Scios, Helios, Certus, and ExSolve products. Applied Beams offers an extensive set of FIB and SEM consumables for these systems, at lower acquisition and operating costs.

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